{"40609":{"#nid":"40609","#data":{"uid":"27301","author":"Elizabeth Campell","created_gmt":"2015-12-03 20:23:40","changed_gmt":"2016-10-08 02:36:58","title":"The probabalistic CMOS test chip being tested in t","body":[],"groups":[{"id":"1183","name":"Home"}],"keywords":[]}}}