{"582273":{"#nid":"582273","#data":{"type":"news","title":"Chatterjee, Ph.D. Students Tapped for IEEE Best Paper Award","body":[{"value":"\u003Cp\u003EAbhijit Chatterjee and both his present and former Ph.D. students \u0026ndash; Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey Jr., Thomas Moon, Xian Wang, and Hyun Choi \u0026mdash; have been chosen for the 2015 \u003Cem\u003EJournal of Electronic Testing: Theory and Applications\u003C\/em\u003E (JETTA)\/IEEE Test Technology Technical Council Best Paper Award.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EA professor in the Georgia Tech School of Electrical and Computer Engineering (ECE), Chatterjee and his team will receive this award for their paper, \u0026ldquo;Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware,\u0026rdquo; at the 2016 International Test Conference, to be held November 15-17 in Fort Worth, Texas. The paper was published in the February 2015 issue of \u003Cem\u003EJETTA\u003C\/em\u003E, volume 31, number 1, pages 85-98. \u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cp\u003ECharacterizing the spectrum of sparse wideband signals of high-speed devices efficiently and precisely is critical in high-speed test instrumentation design. Recently proposed sub-Nyquist rate sampling systems have the potential to significantly reduce the cost and complexity of sparse spectrum characterization; however, due to imperfections and variations in hardware design, numerous implementation and calibration issues have arisen and need to be solved for robust and stable signal acquisition. Synchronization of the test input signal with the test acquisition system is a major problem requiring specialized design effort.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EIn the research presented in this paper, a low-cost and low-complexity hardware architecture and associated asynchronous (incoherent)\u0026nbsp;multi-rate sub-Nyquist rate sampling based algorithms for sparse spectrum characterization were developed. The proposed scheme can be implemented with a single ADC or with multiple ADCs as in multi-channel or band-interleaved sensing architectures. Compared to other sub-Nyquist rate sampling methods, the proposed hardware scheme can achieve wideband sparse spectrum characterization with minimum cost and calibration effort.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EHardware prototypes built using off-the-shelf components demonstrate that high-speed signals can be acquired using incoherent undersamplng with sampling clocks running at fractions of the Nyquist rate. Work is under way to extend these techniques for acquisition of high-speed test signals in the 20 GHz to 60GHz range using incoherent undersampling combined with bandwidth interleaving.\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"\u003Cp\u003EECE Professor Abhijit Chatterjee and a team of\u0026nbsp;his present and former Ph.D. students have been chosen for the 2015 \u003Cem\u003EJournal of Electronic Testing: Theory and Applications\u003C\/em\u003E (JETTA)\/IEEE Test Technology Technical Council Best Paper Award.\u0026nbsp;\u003C\/p\u003E\r\n","format":"limited_html"}],"field_summary_sentence":[{"value":"ECE Professor Abhijit Chatterjee and a team of his present and former Ph.D. students have been chosen for the 2015 Journal of Electronic Testing: Theory and Applications (JETTA)\/IEEE Test Technology Technical Council Best Paper Award. "}],"uid":"27241","created_gmt":"2016-10-07 15:27:57","changed_gmt":"2016-10-07 15:27:57","author":"Jackie Nemeth","boilerplate_text":"","field_publication":"","field_article_url":"","dateline":{"date":"2016-10-07T00:00:00-04:00","iso_date":"2016-10-07T00:00:00-04:00","tz":"America\/New_York"},"extras":[],"hg_media":{"582269":{"id":"582269","type":"image","title":"Barry Muldrey and Abhijit Chatterjee","body":null,"created":"1475850884","gmt_created":"2016-10-07 14:34:44","changed":"1475850884","gmt_changed":"2016-10-07 14:34:44","alt":"","file":{"fid":"221953","name":"Barry Muldrey and Abhijit Chatterjee.jpg","image_path":"\/sites\/default\/files\/images\/Barry%20Muldrey%20and%20Abhijit%20Chatterjee.jpg","image_full_path":"http:\/\/tlwarc.hg.gatech.edu\/\/sites\/default\/files\/images\/Barry%20Muldrey%20and%20Abhijit%20Chatterjee.jpg","mime":"image\/jpeg","size":963188,"path_740":"http:\/\/tlwarc.hg.gatech.edu\/sites\/default\/files\/styles\/740xx_scale\/public\/images\/Barry%20Muldrey%20and%20Abhijit%20Chatterjee.jpg?itok=Dd9mQnOR"}}},"media_ids":["582269"],"related_links":[{"url":"https:\/\/www.ece.gatech.edu\/faculty-staff-directory\/abhijit-chatterjee","title":"Abhijit Chatterjee"},{"url":"http:\/\/www.ece.gatech.edu","title":"School of Electrical and Computer Engineering"},{"url":"http:\/\/www.gatech.edu","title":"Georgia Tech"},{"url":"http:\/\/itctestweek.org","title":"International Test Conference"},{"url":"http:\/\/link.springer.com\/journal\/10836","title":"Journal of Electronic Testing: Theory and Applications"}],"groups":[{"id":"1255","name":"School of Electrical and Computer Engineering"}],"categories":[{"id":"134","name":"Student and Faculty"},{"id":"8862","name":"Student Research"},{"id":"135","name":"Research"},{"id":"153","name":"Computer Science\/Information Technology and Security"},{"id":"145","name":"Engineering"},{"id":"149","name":"Nanotechnology and Nanoscience"},{"id":"150","name":"Physics and Physical Sciences"}],"keywords":[{"id":"2491","name":"Abhijit Chatterjee"},{"id":"166855","name":"School of Electrical and Computer Engineering"},{"id":"109","name":"Georgia Tech"},{"id":"167026","name":"International Test Conference"},{"id":"167027","name":"Journal of Electronic Testing: Theory and Applications"},{"id":"5660","name":"algorithms"},{"id":"167028","name":"hardware"},{"id":"167029","name":"high-speed devices"}],"core_research_areas":[{"id":"39431","name":"Data Engineering and Science"},{"id":"39451","name":"Electronics and Nanotechnology"}],"news_room_topics":[],"event_categories":[],"invited_audience":[],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003EJackie Nemeth\u003C\/p\u003E\r\n\r\n\u003Cp\u003ESchool of Electrical and Computer Engineering\u003C\/p\u003E\r\n\r\n\u003Cp\u003E404-894-2906\u003C\/p\u003E\r\n","format":"limited_html"}],"email":["jackie.nemeth@ece.gatech.edu"],"slides":[],"orientation":[],"userdata":""}}}