{"591658":{"#nid":"591658","#data":{"type":"external_news","title":"AI Detective Analyses Police Data to Learn How to Crack Cases","body":[{"value":"\u003Cp\u003EIn a story about how police are trialling a computer system that can piece together what may have happened at a crime scene, School of Interactive Computing Associate Professor Mark Riedl cautions that, while machine learning can help police, it will also introduce new biases.\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":"","uid":"33939","created_gmt":"2017-05-11 13:35:32","changed_gmt":"2017-05-11 13:35:32","author":"David Mitchell","boilerplate_text":"","field_publication":"","field_article_url":"","publication_url":"https:\/\/www.newscientist.com\/article\/mg23431254-000-ai-detective-analyses-police-data-to-learn-how-to-crack-cases\/","dateline":{"date":"2017-05-11T00:00:00-04:00","iso_date":"2017-05-11T00:00:00-04:00","tz":"America\/New_York"},"extras":[],"hg_media":{"443661":{"id":"443661","type":"image","title":"Mark Riedl","body":null,"created":"1449256205","gmt_created":"2015-12-04 19:10:05","changed":"1475895182","gmt_changed":"2016-10-08 02:53:02","alt":"Mark Riedl","file":{"fid":"203133","name":"5-mark_riedl.jpg","image_path":"\/sites\/default\/files\/images\/5-mark_riedl_0.jpg","image_full_path":"http:\/\/tlwarc.hg.gatech.edu\/\/sites\/default\/files\/images\/5-mark_riedl_0.jpg","mime":"image\/jpeg","size":7209470,"path_740":"http:\/\/tlwarc.hg.gatech.edu\/sites\/default\/files\/styles\/740xx_scale\/public\/images\/5-mark_riedl_0.jpg?itok=T0dyacR8"}}},"media_ids":["443661"],"groups":[{"id":"47223","name":"College of Computing"},{"id":"1299","name":"GVU Center"},{"id":"50876","name":"School of Interactive Computing"}],"categories":[],"keywords":[{"id":"174417","name":"Mark Riedl; AI; School of Interactive Computing; machine learning"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[],"invited_audience":[],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[],"email":[],"slides":[],"orientation":[],"userdata":""}}}