{"610604":{"#nid":"610604","#data":{"type":"event","title":"MCF Workshop - Overview to Atomic Force Microscopy","body":[{"value":"\u003Cp\u003EThis workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM). Topic that will be covered include:\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003E\u0026nbsp;\u0026nbsp;\u0026nbsp; Theoretical basis of Atomic Force Microscopy\u003C\/li\u003E\r\n\t\u003Cli\u003E\u0026nbsp;\u0026nbsp;\u0026nbsp; Important considerations when choosing an AFM instrument\u003C\/li\u003E\r\n\t\u003Cli\u003E\u0026nbsp;\u0026nbsp;\u0026nbsp; Applications for AFM measurements\u003C\/li\u003E\r\n\t\u003Cli\u003E\u0026nbsp;\u0026nbsp;\u0026nbsp; Hands-on measurement with model samples\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003ERegister at: https:\/\/learnaboutafhatgt.eventbrite.com\u003C\/p\u003E\r\n\r\n\u003Cp\u003EContact Dr. Walter Henderson at: walter.henderson@ien.gatech.edu for more information.\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM)"}],"uid":"27863","created_gmt":"2018-08-30 15:26:53","changed_gmt":"2018-08-30 15:26:53","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2018-09-13T10:00:00-04:00","event_time_end":"2018-09-13T16:00:00-04:00","event_time_end_last":"2018-09-13T16:00:00-04:00","gmt_time_start":"2018-09-13 14:00:00","gmt_time_end":"2018-09-13 20:00:00","gmt_time_end_last":"2018-09-13 20:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"213791","name":"3D Systems Packaging Research Center"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"1271","name":"NanoTECH"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"}],"categories":[],"keywords":[{"id":"3013","name":"atomic force microscopy"},{"id":"7392","name":"microscopy"},{"id":"174583","name":"The Materials Characteriazation Facility"},{"id":"166968","name":"the Institute for Electronics and Nanotechnology"},{"id":"178882","name":"the School of Materials Science and Egineering"},{"id":"107","name":"Nanotechnology"},{"id":"277","name":"Biology"},{"id":"178895","name":"imaging techniques"},{"id":"3845","name":"workshop"},{"id":"91891","name":"cleanroom training"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"177814","name":"Postdoc"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u0026nbsp;Dr. Walter Henderson: walter.henderson@ien.gatech.edu\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}