{"613896":{"#nid":"613896","#data":{"type":"event","title":"Georgia Tech Characterization Short Course Series: Surface Science Techniques \u2013 Focus on Photoelectron Spectroscopy and ToF-SIMS","body":[{"value":"\u003Cdiv\u003E\r\n\u003Cdiv\u003E\r\n\u003Cdiv\u003E\u003Cstrong\u003EDescription:\u003C\/strong\u003EThe Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on \u0026ldquo;Surface Science Techniques \u0026ndash; Focus on Photoelectron Spectroscopy and ToF-SIMS\u0026rdquo; on December\u0026nbsp; 13 \u0026amp; 14, 2018.\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\u0026nbsp;\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003EThis 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in XPS and\/or SIMS. It will cover essential surface science analytical techniques, including point spectra, area maps, and depth profiles as well as sample preparation techniques.\u003C\/div\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\u0026nbsp;\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003EAttendees will learn how to choose and prepare suitable samples, set up and execute an experiment, and analyze data. This course is suitable for both new and experienced researchers.\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\u0026nbsp;\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\u003Cstrong\u003ETarget Audience:\u003C\/strong\u003E\u003Cbr \/\u003E\r\nAttendance is open to researchers from academia, industry and government laboratories\/ organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.\u003C\/div\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003E\r\n\u003Cp\u003E\u003Cstrong\u003ERates\u003C\/strong\u003E:\u003Cstrong\u003E *Rates include lunches on all days*\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EGeorgia Tech Rate: $150\u003Cbr \/\u003E\r\nAcademic and Government Rate: $250\u003Cbr \/\u003E\r\nIndustry Rate: $500\u003C\/p\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Ch2\u003E\u003Cstrong\u003EAgenda\u003C\/strong\u003E\u003C\/h2\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EDay1 \u0026ndash; Photoelectron Spectroscopy:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003E08:30 \u0026ndash; Registration starts\u003C\/p\u003E\r\n\r\n\u003Cp\u003E09:00:\u0026nbsp; Introduction and Scope of Short Course \u0026ndash; Prof. F. Alamgir\u003C\/p\u003E\r\n\r\n\u003Cp\u003EMorning session including the following activities:\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003ELecture onTheoretical background of Photoelectron Spectroscopy\u003C\/li\u003E\r\n\t\u003Cli\u003ETour of MCF characterization labs\u003C\/li\u003E\r\n\t\u003Cli\u003ECoffee break\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003E12:00 \u0026ndash; 13:00:\u0026nbsp; Lunch break\u003C\/p\u003E\r\n\r\n\u003Cp\u003EAfternoon session include the following activities:\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003EIntroduction to XPS analysis software\u003C\/li\u003E\r\n\t\u003Cli\u003EXPS hands-on operation and data analysis sessions.\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003E15:10 \u0026ndash; 16:00:\u0026nbsp; General comments:\u0026nbsp; Open question and answer session\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EDay2 \u0026ndash; Time of Flight SIMS:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003E09:00 \u0026ndash; Breakfast starts\u003C\/p\u003E\r\n\r\n\u003Cp\u003E09:30:\u0026nbsp; Introduction\u0026ndash; Prof. F. Alamgir\u003C\/p\u003E\r\n\r\n\u003Cp\u003EMorning session including the following activities:\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003ETour of IEN microfabrication facility\u003C\/li\u003E\r\n\t\u003Cli\u003ECoffee break\u003C\/li\u003E\r\n\t\u003Cli\u003EPractical concerns for ToF-SIMS and Alternate Surface Science Techniques\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003E11:30 \u0026ndash; 13:00:\u0026nbsp; Lunch break\u003C\/p\u003E\r\n\r\n\u003Cp\u003EAfternoon session including the following activities:\u0026nbsp;\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003ERemote Demonstration of ToF-SIMS operation\u003C\/li\u003E\r\n\t\u003Cli\u003EToF-SIMS Data analysis and\/or hands-on session.\u003C\/li\u003E\r\n\t\u003Cli\u003EOpen question and answer session\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n\r\n\u003Cp\u003E16:00: Closing comments\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Ca href=\u0022http:\/\/events.r20.constantcontact.com\/register\/event?llr=m48bm8rab\u0026amp;oeidk=a07eftlgg75929b4f7e\u0022\u003E\u003Cstrong\u003EREGISTER FOR THE COURSE AT THIS LINK\u003C\/strong\u003E\u003C\/a\u003E\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"\u003Cdiv\u003E\u003Cstrong\u003EDescription:\u003C\/strong\u003E\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003EThe Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on \u0026ldquo;Surface Science Techniques \u0026ndash; Focus on Photoelectron Spectroscopy and ToF-SIMS\u0026rdquo; on December\u0026nbsp; 13 \u0026amp; 14, 2018.\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003EThis 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in XPS and\/or SIMS. It will cover essential surface science analytical techniques, including point spectra, area maps, and depth profiles as well as sample preparation techniques.\u003C\/div\u003E\r\n","format":"limited_html"}],"field_summary_sentence":[{"value":"Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces."}],"uid":"27863","created_gmt":"2018-11-05 20:54:31","changed_gmt":"2018-11-14 19:36:53","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2018-12-13T20:30:00-05:00","event_time_end":"2018-12-14T16:00:00-05:00","event_time_end_last":"2018-12-14T16:00:00-05:00","gmt_time_start":"2018-12-14 01:30:00","gmt_time_end":"2018-12-14 21:00:00","gmt_time_end_last":"2018-12-14 21:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"213791","name":"3D Systems Packaging Research Center"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"1271","name":"NanoTECH"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"}],"categories":[],"keywords":[{"id":"109341","name":"Materials Characterization Facility"},{"id":"84291","name":"materials characterization"},{"id":"167218","name":"short course"},{"id":"179618","name":"surface science"},{"id":"97571","name":"ToF-SIMS"},{"id":"174703","name":"Photoelectron Spectroscopy"},{"id":"178804","name":"XPS"},{"id":"107","name":"Nanotechnology"},{"id":"12701","name":"Institute for Electronics and Nanotechnology"},{"id":"173667","name":"the School of Materials Science and Engineernig"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"177814","name":"Postdoc"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003EQuestions? Contact:\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003EDr. Walter Henderson\u003C\/strong\u003E\u003Cbr \/\u003E\r\nGeorgia Tech Institute for Electronics and Nanotechnology\u003Cbr \/\u003E\r\n404.894.4702\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}