{"658297":{"#nid":"658297","#data":{"type":"news","title":"ECE Researchers Win\u00a02021 Richard B. Shultz Best Transaction Paper Award","body":[{"value":"\u003Cp\u003EA journal paper published by a team of Georgia Tech School of Electrical and Computer Engineering (ECE) researchers has received the\u0026nbsp;2021 Richard B. Shultz Best Transaction Paper Award\u0026nbsp;of IEEE Transactions on Electromagnetic Compatibility (IEEE T-EMC). The paper was selected from 242 papers published in 2021 IEEE T-EMC through a rigorous review and consideration of editorial board.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe paper, \u0026ldquo;\u003Ca href=\u0022https:\/\/ieeexplore.ieee.org\/document\/9165881\u0022\u003EWorst-Case Eye Analysis of High-Speed Channels Based on Bayesian Optimization,\u0026rdquo;\u003C\/a\u003E\u0026nbsp;was authored by four researchers from Georgia Tech: Madhavan Swaminathan (John Pippin Chair and director of the 3D Systems Packaging Research Center), Sung Kyu Lim (Motorola Solutions Foundation Professor), Majid Ahadi Dolatsara (former Ph.D. candidate currently at Keysight Technologies) and Jinwoo Kim (Ph.D. candidate), and two researchers from IBM: Wiren Dale Becker and Jose Ale Hejase.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EWith the exponential increase of bitrate in recent years, it has become considerably harder to avoid communication failure when a signal passes through a high-speed channel. Therefore, designers rely on rigorous modeling and simulation in the early stages of design of high-speed channels to predict the jitter and noise. A common analysis to evaluate the quality of the signal is the eye diagram analysis.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EIn the award-winning article, an optimization-based algorithm for quick evaluation of the eye diagram, dubbed worst-eye analysis, is suggested. Traditionally, eye diagram analysis is performed using a lengthy transient simulation, which can be prohibitive. The team\u0026rsquo;s proposed approach focuses on the inter-symbol interference since its effect can span over many symbols and include crosstalk (unwanted signals in a communication channel), making it challenging to model.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe new algorithm calculates the data patterns leading to the lowest voltage corresponding to a high symbol, the highest voltage corresponding to a low symbol, and the times of minimum and maximum level crossing points. Then, eye height (EH), eye width (EW), and the worst-case eye opening are estimated using these points. To reduce complexity, the proposed approach includes a mapping algorithm that exploits the Gray code \u0026mdash; an ordering of the\u0026nbsp;binary numeral system\u0026nbsp;such that two successive values differ in only one\u0026nbsp;bit.\u003C\/p\u003E\r\n\r\n\u003Cp\u003ENumerical results from the team\u0026rsquo;s analysis showed that the worst-eye proposed approach can accurately find the EW and EH with up to 47 times speedup, and the worst-case eye opening with up to 23 times speedup, when compared with the lengthy transient simulation.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe work was supported in part by the DARPA CHIPS Project under Award N00014-17-1-2950, and in part by the National Science Foundation under Grant CNS 16-24731\u0026mdash;Center for Advanced Electronics through Machine Learning and its industry members.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe award will be presented to the team at the annual\u0026nbsp;\u003Ca href=\u0022https:\/\/emc2022.emcss.org\/\u0022\u003EIEEE EMC+SIPI Symposium\u003C\/a\u003E\u0026nbsp;in Spokane, Wash. this August.\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"In the award-winning article, an optimization-based algorithm for quick evaluation of the eye diagram, dubbed worst-eye analysis, is suggested."}],"uid":"36172","created_gmt":"2022-05-18 14:10:43","changed_gmt":"2022-05-19 18:02:39","author":"dwatson71","boilerplate_text":"","field_publication":"","field_article_url":"","dateline":{"date":"2022-05-18T00:00:00-04:00","iso_date":"2022-05-18T00:00:00-04:00","tz":"America\/New_York"},"extras":[],"hg_media":{"658296":{"id":"658296","type":"image","title":"Eye diagram analysis","body":null,"created":"1652882825","gmt_created":"2022-05-18 14:07:05","changed":"1652882825","gmt_changed":"2022-05-18 14:07:05","alt":"Eye diagram analysis showing transient eye and the worst-eye waveforms.","file":{"fid":"249540","name":"GRPHIC_IEEE T-EMC Best Transaction.jpg","image_path":"\/sites\/default\/files\/images\/GRPHIC_IEEE%20T-EMC%20Best%20Transaction.jpg","image_full_path":"http:\/\/tlwarc.hg.gatech.edu\/\/sites\/default\/files\/images\/GRPHIC_IEEE%20T-EMC%20Best%20Transaction.jpg","mime":"image\/jpeg","size":1392116,"path_740":"http:\/\/tlwarc.hg.gatech.edu\/sites\/default\/files\/styles\/740xx_scale\/public\/images\/GRPHIC_IEEE%20T-EMC%20Best%20Transaction.jpg?itok=YmrWPlxu"}},"646902":{"id":"646902","type":"image","title":"Madhavan Swaminathan","body":null,"created":"1619473945","gmt_created":"2021-04-26 21:52:25","changed":"1619473945","gmt_changed":"2021-04-26 21:52:25","alt":"photograph of Madhavan Swaminathan","file":{"fid":"245575","name":"Swami cropped.jpg","image_path":"\/sites\/default\/files\/images\/Swami%20cropped.jpg","image_full_path":"http:\/\/tlwarc.hg.gatech.edu\/\/sites\/default\/files\/images\/Swami%20cropped.jpg","mime":"image\/jpeg","size":675387,"path_740":"http:\/\/tlwarc.hg.gatech.edu\/sites\/default\/files\/styles\/740xx_scale\/public\/images\/Swami%20cropped.jpg?itok=BivrtU8q"}},"657975":{"id":"657975","type":"image","title":"Sung-Kyu Lim 2022","body":null,"created":"1651706638","gmt_created":"2022-05-04 23:23:58","changed":"1651706638","gmt_changed":"2022-05-04 23:23:58","alt":"","file":{"fid":"249412","name":"Sung-Kyu Lim _72.jpg","image_path":"\/sites\/default\/files\/images\/Sung-Kyu%20Lim%20_72.jpg","image_full_path":"http:\/\/tlwarc.hg.gatech.edu\/\/sites\/default\/files\/images\/Sung-Kyu%20Lim%20_72.jpg","mime":"image\/jpeg","size":322188,"path_740":"http:\/\/tlwarc.hg.gatech.edu\/sites\/default\/files\/styles\/740xx_scale\/public\/images\/Sung-Kyu%20Lim%20_72.jpg?itok=fUu545-M"}}},"media_ids":["658296","646902","657975"],"related_links":[{"url":"https:\/\/www.ece.gatech.edu\/faculty-staff-directory\/madhavan-swaminathan","title":"Madhavan Swaminathan "},{"url":"https:\/\/www.ece.gatech.edu\/faculty-staff-directory\/sung-kyu-lim","title":"Sung Kyu Lim "}],"groups":[{"id":"1255","name":"School of Electrical and Computer Engineering"}],"categories":[{"id":"129","name":"Institute and Campus"},{"id":"134","name":"Student and Faculty"},{"id":"135","name":"Research"},{"id":"145","name":"Engineering"}],"keywords":[{"id":"190635","name":"adhavan Swaminathan"},{"id":"171018","name":"Sung Kyu Lim"},{"id":"190631","name":"IEEE Transactions on Electromagnetic Compatibility"},{"id":"190632","name":"2021 Richard B. Shultz Best Transaction Paper Award"},{"id":"190633","name":"Worst-Case Eye Analysis"},{"id":"190634","name":"eye diagram analysis"}],"core_research_areas":[{"id":"39431","name":"Data Engineering and Science"},{"id":"39451","name":"Electronics and Nanotechnology"}],"news_room_topics":[],"event_categories":[],"invited_audience":[],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Cstrong\u003EDan Watson\u003C\/strong\u003E\u003Cbr \/\u003E\r\n\u003Ca href=\u0022http:\/\/dwatson@ece.gatech.edu\u0022\u003Edwatson@ece.gatech.edu\u003C\/a\u003E\u003C\/p\u003E\r\n","format":"limited_html"}],"email":["dwatson@ece.gatech.edu"],"slides":[],"orientation":[],"userdata":""}}}